DocumentCode
958476
Title
Comment on "A Nonlinear Mapping for Data Structure Analysis
Author
White, I.
Author_Institution
Electronics Research Laboratory, Plessey Company, Havant, England.
Issue
2
fYear
1972
Firstpage
220
Lastpage
221
Abstract
An alternative metric for use with Sammon´s nonlinear mapping is suggested. Rather than Euclidean, the Hamming metric is proposed as a means of reducing the iteration time.
Keywords
Arrays; Computers; Distance measurement; Electrical engineering; Euclidean distance; Pattern recognition; Training; Dimensionality; mapping; multivariant data analysis; pattern recognition;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/TC.1972.5008933
Filename
5008933
Link To Document