DocumentCode
958490
Title
Zinc Oxide-Bismuth Oxide Low Q Decoupling Capacitor
Author
Delaney, R. ; Kaiser, H.
Author_Institution
IBM Components Division,East Fishkill, NY
Issue
42371
fYear
1966
Firstpage
9
Lastpage
24
Abstract
A description and analysis are presented of the fabrication and electrical properties of a non-ferroelectric material with a high apparent dielectric constant over a wide frequency range into the megacycle region. This material is zinc oxide with additions of bismuth oxide. Specific attention is focused on those properties which make the material uniquely suited for microminiature high-frequency low impedance decoupling capacitors. With proper processing, apparent dielectric constants on the order of 1500 at 5 Mc/s are reached. Using silk screening techniques, capacitors with values up to 100µF/in2have been obtained, but at the expense of a very low (10
-cm) dc resistivity. Usable devices with dc resistances of a few hundred to a few thousand ohms have capacitances in the I to 50 µF region. This device is also capable of strongly attenuating inductive noise signals and exhibits a constant total impedance of 2 to 3 ohms in the 10 to 100 mc/s range.
-cm) dc resistivity. Usable devices with dc resistances of a few hundred to a few thousand ohms have capacitances in the I to 50 µF region. This device is also capable of strongly attenuating inductive noise signals and exhibits a constant total impedance of 2 to 3 ohms in the 10 to 100 mc/s range.Keywords
Bismuth; Capacitors; Conductivity; Dielectric constant; Dielectric materials; Fabrication; Frequency; High-K gate dielectrics; Impedance; Zinc oxide;
fLanguage
English
Journal_Title
Parts, Materials and Packaging, IEEE Transactions on
Publisher
ieee
ISSN
0018-9502
Type
jour
DOI
10.1109/TPMP.1966.1135548
Filename
1135548
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