• DocumentCode
    958490
  • Title

    Zinc Oxide-Bismuth Oxide Low Q Decoupling Capacitor

  • Author

    Delaney, R. ; Kaiser, H.

  • Author_Institution
    IBM Components Division,East Fishkill, NY
  • Issue
    42371
  • fYear
    1966
  • Firstpage
    9
  • Lastpage
    24
  • Abstract
    A description and analysis are presented of the fabrication and electrical properties of a non-ferroelectric material with a high apparent dielectric constant over a wide frequency range into the megacycle region. This material is zinc oxide with additions of bismuth oxide. Specific attention is focused on those properties which make the material uniquely suited for microminiature high-frequency low impedance decoupling capacitors. With proper processing, apparent dielectric constants on the order of 1500 at 5 Mc/s are reached. Using silk screening techniques, capacitors with values up to 100µF/in2have been obtained, but at the expense of a very low (10 \\Omega -cm) dc resistivity. Usable devices with dc resistances of a few hundred to a few thousand ohms have capacitances in the I to 50 µF region. This device is also capable of strongly attenuating inductive noise signals and exhibits a constant total impedance of 2 to 3 ohms in the 10 to 100 mc/s range.
  • Keywords
    Bismuth; Capacitors; Conductivity; Dielectric constant; Dielectric materials; Fabrication; Frequency; High-K gate dielectrics; Impedance; Zinc oxide;
  • fLanguage
    English
  • Journal_Title
    Parts, Materials and Packaging, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9502
  • Type

    jour

  • DOI
    10.1109/TPMP.1966.1135548
  • Filename
    1135548