DocumentCode :
958548
Title :
Current Ideas in the Philosophy of Testing Electrical Contacts
Author :
Ulsh, H.
Author_Institution :
IBM Corp.,Endicott, NY
Issue :
3
fYear :
1966
fDate :
9/1/1966 12:00:00 AM
Firstpage :
68
Lastpage :
70
Abstract :
In computer equipment, the large number of connector type contacts alone require a very reliable component. There is a definite need for obtaining a better understanding of the modes of failure in real-life environments so that new and better test methods can be developed. This paper reviews testing methods and the philosophy of evaluating electrical contacts.
Keywords :
Contact failure mechanisms; Contact reliability testing; Contact test methods; Contacts; Aging; Connectors; Contact resistance; Electrical resistance measurement; Failure analysis; Information retrieval; Life testing; Pollution measurement; Probes; Reliability engineering;
fLanguage :
English
Journal_Title :
Parts, Materials and Packaging, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9502
Type :
jour
DOI :
10.1109/TPMP.1966.1135556
Filename :
1135556
Link To Document :
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