Title : 
Current Ideas in the Philosophy of Testing Electrical Contacts
         
        
        
            Author_Institution : 
IBM Corp.,Endicott, NY
         
        
        
        
            fDate : 
9/1/1966 12:00:00 AM
         
        
        
        
            Abstract : 
In computer equipment, the large number of connector type contacts alone require a very reliable component. There is a definite need for obtaining a better understanding of the modes of failure in real-life environments so that new and better test methods can be developed. This paper reviews testing methods and the philosophy of evaluating electrical contacts.
         
        
            Keywords : 
Contact failure mechanisms; Contact reliability testing; Contact test methods; Contacts; Aging; Connectors; Contact resistance; Electrical resistance measurement; Failure analysis; Information retrieval; Life testing; Pollution measurement; Probes; Reliability engineering;
         
        
        
            Journal_Title : 
Parts, Materials and Packaging, IEEE Transactions on
         
        
        
        
        
            DOI : 
10.1109/TPMP.1966.1135556