• DocumentCode
    958665
  • Title

    Bounds on the Length of Terminal Stuck-Fault Test

  • Author

    Weiss, C.Dennis

  • Author_Institution
    Department of Electrical Engineering, Johns Hopkins University, Baltimore, Md. 21218.
  • Issue
    3
  • fYear
    1972
  • fDate
    3/1/1972 12:00:00 AM
  • Firstpage
    305
  • Lastpage
    309
  • Abstract
    A terminal stuck fault in a logic network is represented by one or more stuck-at-1 or stuck-at-0 faults on the n input lines or single output. It is shown that for n ¿ 5, a least upper bound on the test length is n + 1, and for n ≫ 5, an upper bound is 2n - 4. A greatest lower bound is 3, for all n ≫ 1. The upper bounds are based on a maximum size alternating 1-tree in the n-cube representation of the function. Of the more than 600 000 equivalence classes of functions of n variables, n ¿ 5, only one does not have an n-edge alternating 1-tree. An algorithm is proposed for constructing tests based on alternating 1-trees.
  • Keywords
    Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Logic testing; Switching circuits; Tree graphs; Upper bound; Bounds; fault detection; graphs; multiple faults; terminal stuck faults; test length; trees;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/TC.1972.5008955
  • Filename
    5008955