• DocumentCode
    958783
  • Title

    Some Fundamental Properties of Aluminum-Aluminum Electrical Contacts

  • Author

    Timsit, R.S.

  • Author_Institution
    Aluminum Company of Canada
  • Volume
    3
  • Issue
    1
  • fYear
    1980
  • fDate
    3/1/1980 12:00:00 AM
  • Firstpage
    71
  • Lastpage
    79
  • Abstract
    The results of a fundamental Investigation of the properties of stationary aluminum-aluminum (AA1350) electrical contacts at room temperature both in an ultrahigh vacuum and in an oxygen atmosphere are reported. The contact couples consist of two polished spherical surfaces held together under constant load over a small area; the work was carried out in an environmental chamber which allows manipulation of the contact samples and external adjustment of contact loads. The loads required to rupture the oxide films on the contact surfaces have been measured and yield estimates of fracture strain for aluminum oxide films in compression. Once the insulating oxide films are ruptured, the area of metallic contact is generally found to grow with time. In a vacuum the growth rate is consistent with the rates predicted from sintering theory; the experimental evidence suggests that sintering is driven by capillarity forces and controlled largely by dislocation creep. Growth in oxygen is slower but can be also understood qualitatively in terms of creep-controlled sintering. Although growth in electrical contacts has been observed by earlier investigators, this is the first time that the phenomenon has been correlated with sintering. These results suggest that stationary aluminum-aluminum electrical contacts are characterized by "self-heal" properties which should be conducive to exceptionally stable performance in a vacuum or in an Inert gas environment.
  • Keywords
    Aluminum; Contacts; Aluminum oxide; Atmosphere; Contacts; Creep; Force control; Insulation; Strain measurement; Surface cracks; Temperature; Yield estimation;
  • fLanguage
    English
  • Journal_Title
    Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0148-6411
  • Type

    jour

  • DOI
    10.1109/TCHMT.1980.1135582
  • Filename
    1135582