DocumentCode :
958931
Title :
Device component margin evaluation using generalized field interruption technique
Author :
Chen, T.T. ; Tocci, L.R. ; Archer, J.L.
Author_Institution :
Rockwell International, Anaheim, California
Volume :
12
Issue :
6
fYear :
1976
fDate :
11/1/1976 12:00:00 AM
Firstpage :
677
Lastpage :
679
Abstract :
A generalized field interruption technique is evaluated for bubble memory chip margin analysis. Using a short bubble stream and measuring the averaged propagation steps for the first error in a given data pattern, field interruption offers a statistically significant measurement of the failure probability for a small segment of a complete bubble memory device. This technique also allows an individual component margin measurement independent of the rest of the device. A practical example is given using a 100K bit serial loop memory chip which is composed of various components and which also contains a weak processing defect. The component margin measurements show that at low driving fields the chip operation is limited by the passive replicator component, while at high driving fields operation is limited by the permalloy defect.
Keywords :
Component reliability; Magnetic bubble devices; Memory testing; Coils; Electromagnetic measurements; Gaussian processes; Magnetic field measurement; Magnetostatics; Probability; Pulse measurements; Semiconductor device measurement; Spirals; Temperature;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.1976.1059105
Filename :
1059105
Link To Document :
بازگشت