DocumentCode

958954

Title

Author´s reply

Author

Koh, Kyung Shik

Author_Institution

Department of Electrical Engineering, Inha Institute of Technology, Inchon, Korea.

Issue

4

fYear

1972

fDate

4/1/1972 12:00:00 AM

Firstpage

408

Lastpage

408

Keywords

Correlation; Feature extraction; Minimization; Pattern classification; Pattern recognition; Probability density function; Radiation detectors;

fLanguage

English

Journal_Title

Computers, IEEE Transactions on

Publisher

ieee

ISSN

0018-9340

Type

jour

DOI

10.1109/TC.1972.5008988

Filename

5008988