DocumentCode :
958970
Title :
A Semi-Theoretical Fluorescent Lamp Model for Time-Domain Transient and Steady-State Simulations
Author :
Wei Yan ; Tam, E. ; Hui, S.Y.
Author_Institution :
City Univ. of Hong Kong, Kowloon
Volume :
22
Issue :
6
fYear :
2007
Firstpage :
2106
Lastpage :
2115
Abstract :
Low-pressure discharge lamps obey a set of physical laws that are different from those of high-pressure discharge lamps. In this paper, these differences are addressed. Based on a recently developed HID lamp model frame, a semi-theoretical fluorescent lamp model that can be determined by genetic algorithms and simple electrical measurements is presented. This model does not require any lamp data from lamp manufacturers. Its parameters can be determined from electrical voltage and current measurements of the lamps under AC operation at mains frequency. With the same set of parameters, the model can predict the lamp terminal characteristics accurately under low, medium and high frequency operations. Good simulation results were achieved when the lamp power was reduced to 60% of rated power and when the lamp was operated under step-up and step-down transient processes. Simulation results for different sizes of tubular and compact fluorescent lamps agree well with their experimental results. Particularly, the differences between simulation results and experimental results under rated power are less than 10%. Hence, the proposed model shows a good degree of accuracy: 1) for different types of fluorescent lamps; 2) at different operating frequencies; 3) under different dimming levels; and 4) during step-up and step-down transient processes.
Keywords :
electric current measurement; fluorescent lamps; genetic algorithms; voltage measurement; current measurements; dimming levels; electrical measurements; electrical voltage measurements; fluorescent lamp model; genetic algorithms; low-pressure discharge lamps; steady-state simulations; step-down transient processes; step-up transient processes; time-domain transient simulations; Current measurement; Electric variables measurement; Fluorescent lamps; Frequency; Genetic algorithms; High intensity discharge lamps; Steady-state; Time domain analysis; Virtual manufacturing; Voltage; Fluorescent lamp modeling; gas discharge; genetic algorithms; simulation;
fLanguage :
English
Journal_Title :
Power Electronics, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-8993
Type :
jour
DOI :
10.1109/TPEL.2007.909313
Filename :
4371568
Link To Document :
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