• DocumentCode
    958970
  • Title

    A Semi-Theoretical Fluorescent Lamp Model for Time-Domain Transient and Steady-State Simulations

  • Author

    Wei Yan ; Tam, E. ; Hui, S.Y.

  • Author_Institution
    City Univ. of Hong Kong, Kowloon
  • Volume
    22
  • Issue
    6
  • fYear
    2007
  • Firstpage
    2106
  • Lastpage
    2115
  • Abstract
    Low-pressure discharge lamps obey a set of physical laws that are different from those of high-pressure discharge lamps. In this paper, these differences are addressed. Based on a recently developed HID lamp model frame, a semi-theoretical fluorescent lamp model that can be determined by genetic algorithms and simple electrical measurements is presented. This model does not require any lamp data from lamp manufacturers. Its parameters can be determined from electrical voltage and current measurements of the lamps under AC operation at mains frequency. With the same set of parameters, the model can predict the lamp terminal characteristics accurately under low, medium and high frequency operations. Good simulation results were achieved when the lamp power was reduced to 60% of rated power and when the lamp was operated under step-up and step-down transient processes. Simulation results for different sizes of tubular and compact fluorescent lamps agree well with their experimental results. Particularly, the differences between simulation results and experimental results under rated power are less than 10%. Hence, the proposed model shows a good degree of accuracy: 1) for different types of fluorescent lamps; 2) at different operating frequencies; 3) under different dimming levels; and 4) during step-up and step-down transient processes.
  • Keywords
    electric current measurement; fluorescent lamps; genetic algorithms; voltage measurement; current measurements; dimming levels; electrical measurements; electrical voltage measurements; fluorescent lamp model; genetic algorithms; low-pressure discharge lamps; steady-state simulations; step-down transient processes; step-up transient processes; time-domain transient simulations; Current measurement; Electric variables measurement; Fluorescent lamps; Frequency; Genetic algorithms; High intensity discharge lamps; Steady-state; Time domain analysis; Virtual manufacturing; Voltage; Fluorescent lamp modeling; gas discharge; genetic algorithms; simulation;
  • fLanguage
    English
  • Journal_Title
    Power Electronics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8993
  • Type

    jour

  • DOI
    10.1109/TPEL.2007.909313
  • Filename
    4371568