Title :
A vertical field-effect transistor with an InGaAs/GaAs pseudomorphic planar doped barrier launcher
Author :
Won, Y.H. ; Yamasaki, Kazuhiko ; Tasker, P.J. ; Daniels-Race, T. ; Schaff, W.J. ; Eastman, L.F.
Author_Institution :
Sch. of Electr. Eng., Cornell Univ., Ithaca, NY, USA
fDate :
11/1/1989 12:00:00 AM
Abstract :
Summary form only given. The authors report improved DC performance in a vertical field effect transistor (VFET) by inserting a pseudomorphic n+-InxGa1-xAs (x=0.07) layer between a planar doped barrier (PDB) launcher and an n-channel layer instead of an n+-GaAs layer. In this structure, higher-energy hot electrons can be injected into the channel and the spillover of electrons from the n+-layer to the n-channel can be reduced because of the resulting conduction band discontinuity. A transconductance (maximum gm=400 mS/mm), average electron velocity ( nu av=3.86*107 cm/s), and voltage gain (gm/gd=50) that represent a significant improvement over previous results for VFETs have been obtained.
Keywords :
III-V semiconductors; field effect transistors; gallium arsenide; hot carriers; indium compounds; 400 mS; DC performance; III-V semiconductors; InGaAs-GaAs; VFET; average electron velocity; conduction band discontinuity; hot electrons; planar doped barrier launcher; pseudomorphic n+-InxGa1-xAs layer; transconductance; vertical FET; vertical field-effect transistor; voltage gain; Current measurement; Doping; Electric variables measurement; Electrons; FETs; Gallium arsenide; Indium gallium arsenide; Length measurement; Transconductance; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on