Title :
On the Extraction of Pattern Features from Imperfectly Identified Samples
Author_Institution :
Department of Electrical Engineering, University of Waterloo, Waterloo, Ont., Canada.
fDate :
4/1/1972 12:00:00 AM
Abstract :
The application of Bhattacharyya coefficient for the selection of effective features from imperfectly labeled patterns is examined.
Keywords :
Circuits and systems; Electrons; Feature extraction; Information theory; Network address translation; Probability density function; Probability distribution; Statistical analysis; Statistical distributions; Upper bound; Bhattacharyya coefficient; feature selection; imperfectly identified patterns; pattern recognition; probability of error;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1972.5008992
