• DocumentCode
    959142
  • Title

    High-efficiency 0.25- mu m gate-length pseudomorphic power heterostructure FETs at millimeter-wave frequencies

  • Author

    Lester, L.F. ; Kao, M.-Y. ; Ho, Paul ; Ferguson, D.W. ; Smith, R.P. ; Smith, P.M. ; Ballingall, J.M.

  • Author_Institution
    General Electric Co., Syracuse, NY, USA
  • Volume
    36
  • Issue
    11
  • fYear
    1989
  • fDate
    11/1/1989 12:00:00 AM
  • Firstpage
    2616
  • Lastpage
    2617
  • Abstract
    Summary form only given. The authors compare the 35-GHz power performance of four different 0.25- mu m gate-length pseudomorphic AlGaAs/InGaAs/GaAs heterostructure FET (HFET) devices. The devices that are examined include the HEMT (high-electron-mobility transistor), double-heterojunction HEMT (DHHEMT), doped-channel HFET (DCHFET), and the doped-channel MODFET (DCHMODFET). A maximum 35-GHz power-added-efficiency and a power density of 49% and 0.94 W/mm were measured, for the DCHMODFET; 43% and 0.97 W/mm for the DHHEMT, 32% and 0.75 W/mm for the HEMT, and 31% and 0.77 W/mm for the DCHFET. The DC parameters that influence RF power performance were analyzed, and it was found that the I-V linearities of the DCHMODFET, DCHFET, and DHHEMT are much better than that of the HEMT and that the pinchoff characteristics of the DCHMODFET are superior to those of the DHHEMT. The first point explains why the efficiencies of the DCHMODFET and DHHEMT are significantly better than that of the HEMT. It is believed that the second point is responsible for the better efficiency in the DCHMODFET compared to the DHHEMT.
  • Keywords
    III-V semiconductors; aluminium compounds; gallium arsenide; high electron mobility transistors; indium compounds; power transistors; solid-state microwave devices; 0.25 micron; 31 percent; 32 percent; 35 GHz; 43 percent; 49 percent; AlGaAs-InGaAs-GaAs; DC parameters; GaAs; HEMT; I-V linearities; RF power performance; doped-channel HFET; doped-channel MODFET; double-heterojunction HEMT; gate-length; high-electron-mobility transistor; millimeter-wave frequencies; pinchoff characteristics; power density; power-added-efficiency; pseudomorphic power heterostructure FET; DH-HEMTs; Density measurement; FETs; Frequency; Gallium arsenide; HEMTs; Indium gallium arsenide; MODFETs; Millimeter wave transistors; Power measurement;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.43730
  • Filename
    43730