DocumentCode :
959142
Title :
High-efficiency 0.25- mu m gate-length pseudomorphic power heterostructure FETs at millimeter-wave frequencies
Author :
Lester, L.F. ; Kao, M.-Y. ; Ho, Paul ; Ferguson, D.W. ; Smith, R.P. ; Smith, P.M. ; Ballingall, J.M.
Author_Institution :
General Electric Co., Syracuse, NY, USA
Volume :
36
Issue :
11
fYear :
1989
fDate :
11/1/1989 12:00:00 AM
Firstpage :
2616
Lastpage :
2617
Abstract :
Summary form only given. The authors compare the 35-GHz power performance of four different 0.25- mu m gate-length pseudomorphic AlGaAs/InGaAs/GaAs heterostructure FET (HFET) devices. The devices that are examined include the HEMT (high-electron-mobility transistor), double-heterojunction HEMT (DHHEMT), doped-channel HFET (DCHFET), and the doped-channel MODFET (DCHMODFET). A maximum 35-GHz power-added-efficiency and a power density of 49% and 0.94 W/mm were measured, for the DCHMODFET; 43% and 0.97 W/mm for the DHHEMT, 32% and 0.75 W/mm for the HEMT, and 31% and 0.77 W/mm for the DCHFET. The DC parameters that influence RF power performance were analyzed, and it was found that the I-V linearities of the DCHMODFET, DCHFET, and DHHEMT are much better than that of the HEMT and that the pinchoff characteristics of the DCHMODFET are superior to those of the DHHEMT. The first point explains why the efficiencies of the DCHMODFET and DHHEMT are significantly better than that of the HEMT. It is believed that the second point is responsible for the better efficiency in the DCHMODFET compared to the DHHEMT.
Keywords :
III-V semiconductors; aluminium compounds; gallium arsenide; high electron mobility transistors; indium compounds; power transistors; solid-state microwave devices; 0.25 micron; 31 percent; 32 percent; 35 GHz; 43 percent; 49 percent; AlGaAs-InGaAs-GaAs; DC parameters; GaAs; HEMT; I-V linearities; RF power performance; doped-channel HFET; doped-channel MODFET; double-heterojunction HEMT; gate-length; high-electron-mobility transistor; millimeter-wave frequencies; pinchoff characteristics; power density; power-added-efficiency; pseudomorphic power heterostructure FET; DH-HEMTs; Density measurement; FETs; Frequency; Gallium arsenide; HEMTs; Indium gallium arsenide; MODFETs; Millimeter wave transistors; Power measurement;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.43730
Filename :
43730
Link To Document :
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