Title :
Strain Sensitivity in Thick-Film Resistors
Author :
Canali, Claudio ; Malvasi, D. ; Morten, Bruno ; Prudenziati, Maria ; Taroni, Andrea
Author_Institution :
Instituto di Fisica dell´´Universita,Italy
fDate :
9/1/1980 12:00:00 AM
Abstract :
Piezoresistive properties of Dupont 1400 series thick-film resistors have been investigated by measuring longitudinal and transverse gauge factors as a function of applied strain between 0 and _+ 1000 microstrain in the temperature range from -70 to + 140°C. The relative change in resistance of thick-film resistors is linear, reproducible, and hysteresis free for the full range of applied strain. They appear more sensitive than metal resistors and have a low temperature coefficient of resistance (TCR) and gauge factor.
Keywords :
Piezoresistive transducers; Thick-film resistors; Capacitive sensors; Ceramics; Electrical resistance measurement; Piezoresistance; Resistors; Stability; Strain measurement; Temperature distribution; Temperature sensors; Thickness measurement;
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
DOI :
10.1109/TCHMT.1980.1135638
