DocumentCode
959380
Title
Thick-Film Thermistor and Its Applications
Author
Ikegami, Akira ; Arima, Hideo ; Tosaki, Hiromi ; Matsuoka, Yoshitaka ; Ai, Mitsuro ; Minorikawa, Hitoshi ; Asahino, Yoshio
Author_Institution
Hitachi Ltd.,Japan
Volume
3
Issue
4
fYear
1980
fDate
12/1/1980 12:00:00 AM
Firstpage
541
Lastpage
550
Abstract
The electrical properties, reliability, and several successful applications of a thick-film thermistor are described. The thick-film thermistor is composed of a semiconducting oxide, precious metal (RuO2 ), and glass. The resistivity and thermistor constant are affected to a great extent by the electrical properties of the semiconducting oxide, the particle size of RuO2 , and the characteristics of the glass. The thermal expansion coefficient of the semiconducting oxide is required to be less than 105 x 10-7K-1in order to prevent the cracks in as-fired film. A resistivity ranging from I
2.cm to 10 M
.cm together with a thermistor constant from 100 to 4500 K can be obtained by controlling these factors. These glass coated thick-film thermistors exhibit extremely high stability. An accelerated life test shows the drift rate as less than 0.02 percent/year in the resistance of a thick-film thermistor with a crystallized glass coating. A thick-film thermistor can be used widely as an accurate and stable temperature sensor and as an exact temperature compensating element in a thick-film hybrid circuit.
2.cm to 10 M
.cm together with a thermistor constant from 100 to 4500 K can be obtained by controlling these factors. These glass coated thick-film thermistors exhibit extremely high stability. An accelerated life test shows the drift rate as less than 0.02 percent/year in the resistance of a thick-film thermistor with a crystallized glass coating. A thick-film thermistor can be used widely as an accurate and stable temperature sensor and as an exact temperature compensating element in a thick-film hybrid circuit.Keywords
Bolometers; Thick-film devices; Circuit testing; Conductivity; Glass; Life estimation; Semiconductivity; Semiconductor films; Temperature sensors; Thermal expansion; Thermal stability; Thermistors;
fLanguage
English
Journal_Title
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher
ieee
ISSN
0148-6411
Type
jour
DOI
10.1109/TCHMT.1980.1135644
Filename
1135644
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