Title :
Drift reliability optimization in IC design: generalized formulation and practical examples
Author :
Styblinski, M.A. ; Huang, Min
Author_Institution :
Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA
fDate :
8/1/1993 12:00:00 AM
Abstract :
A generalized formulation of the drift reliability optimization problem is presented. Algorithmic solutions are also proposed. They can be implemented readily in the existing circuit optimization environments and applied to integrated circuit design. Such applications are demonstrated, considering degradations due to hot electron effects. The results show that the proposed approach can significantly increase long-term circuit reliability and increase its robustness
Keywords :
circuit CAD; circuit reliability; hot carriers; integrated circuit technology; optimisation; IC design; circuit optimization environments; drift reliability optimization; hot electron effects; integrated circuit design; Circuit optimization; Circuit simulation; Computational modeling; Degradation; Design optimization; Electrons; Failure analysis; Integrated circuit reliability; Life estimation; Lifetime estimation;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
