A study on a single-unit Markov repairable system with repair time omission

Author

Zheng, Zhihua ; Cui, Lirong ; Hawkes, Alan G.

Author_Institution

Beijing Inst. of Technol., China

Volume

55

Issue

2

fYear

2006

fDate

6/1/2006 12:00:00 AM

Firstpage

182

Lastpage

188

Abstract

This paper introduces a new model for a single-unit Markov repairable system in which repair times that are sufficiently short (less than some critical value) do not result in system failure. We can say that such a repair interval is omitted from the downtime record. First we suppose that the critical repair time is a constant. The model is then generalized to allow the critical repair time to be a non-negative random variable. We calculate system availability for these new models as a measure of reliability. Some numerical examples are given to illustrate the results in the paper.

Keywords

Markov processes; maintenance engineering; reliability; nonnegative random variable; reliability measure; single-unit Markov repairable system; system failure; time interval omission; Availability; Density functional theory; Distribution functions; Exponential distribution; Markov processes; Random variables; State-space methods; Steady-state; Stochastic processes; Weibull distribution; Availability; Markov repairable system; repairable model; time interval omission;

fLanguage

English

Journal_Title

Reliability, IEEE Transactions on

Publisher

ieee

ISSN

0018-9529

Type

jour

DOI

10.1109/TR.2006.874933

Filename

1638402