DocumentCode :
959609
Title :
Characterization of GaAs and InGaAs double-quantum well heterostructure FETs
Author :
Théron, Didier ; Bonte, Bertrand ; Gaquiére, Christophe ; Playez, Edouard ; Crosnier, Yves
Author_Institution :
IEMN-DHS-UMR CNRS, Univ. des Sci. et Technol. de Lille, France
Volume :
40
Issue :
11
fYear :
1993
fDate :
11/1/1993 12:00:00 AM
Firstpage :
1935
Lastpage :
1941
Abstract :
It is pointed out that among the large variety of heterostructure field effect transistors, multichannel devices present a particular originality: their transconductance profile is very flexible and depends on the structure parameters. They are therefore suited for high signal nonlinear applications. The specific case of double quantum-well structures is studied. Conventional and pseudomorphic devices are characterized under DC and RF conditions. Very high current densities (up to 1.2 A/mm) are demonstrated. The effect of different structural parameters on the transconductance and cutoff frequency is discussed. The results are analyzed in order to give a full understanding of these devices and to demonstrate their performances
Keywords :
III-V semiconductors; aluminium compounds; current density; field effect transistors; gallium arsenide; indium compounds; semiconductor quantum wells; solid-state microwave devices; 150 to 300 mS/mm; 40 to 75 GHz; AlGaAs-InGaAs; DC performance; GaAs-AlGaAs; RF conditions; cutoff frequency; double-quantum well heterostructure FETs; high current densities; high signal nonlinear applications; l-V characteristics; microwave characteristics; multichannel devices; pseudomorphic devices; structural parameters; superlattice buffer; transconductance profile; Current density; Cutoff frequency; Gallium arsenide; HEMTs; Indium gallium arsenide; MODFETs; Quantum well devices; Radio frequency; Structural engineering; Transconductance;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.239731
Filename :
239731
Link To Document :
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