• DocumentCode
    959767
  • Title

    An Automatic Test Generation System for Illiac IV Logic Boards

  • Author

    Agrawal, Vishwani D. ; Agrawal, Prathima

  • Author_Institution
    Automation Technology, Inc., Champaign, Ill.; EG&G, Inc., Albuquerque, N. Mex. 87106.
  • Issue
    9
  • fYear
    1972
  • Firstpage
    1015
  • Lastpage
    1017
  • Abstract
    A test generation system, developed for the logic boards of the Illiac IV computer, is described. The system combines the test generation by random patterns and the D-algorithm. Some results are given to illustrate the effectiveness of this approach.
  • Keywords
    Automatic logic units; Automatic testing; Circuit faults; Circuit testing; Fault detection; Flowcharts; Logic testing; Random number generation; System testing; Test pattern generators; D-algorithm; fault diagnosis; off-line computer diagnosis; random test generation; test generation;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/TC.1972.5009081
  • Filename
    5009081
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=959767