DocumentCode
959769
Title
Introduction to the Special Issue on the 2007 International Integrated Reliability Workshop
Author
Lenahan, Patrick M. ; Knowlton, Bill ; Conley, John F. ; Tonti, Bill ; Suehle, John ; Grasser, Tibor
Volume
8
Issue
3
fYear
2008
Firstpage
490
Lastpage
490
Abstract
The six papers in this special section were selected from the presentations at the 2007 IEEE International Integrated Reliability Workshop (IIRW), held near South Lake Tahoe, California, on October 15-18, 2007.
Keywords
CMOS technology; Charge pumps; Conferences; Fuses; Lakes; Measurement techniques; Niobium compounds; Semiconductor device reliability; Special issues and sections; Titanium compounds;
fLanguage
English
Journal_Title
Device and Materials Reliability, IEEE Transactions on
Publisher
ieee
ISSN
1530-4388
Type
jour
DOI
10.1109/TDMR.2008.2006011
Filename
4655592
Link To Document