DocumentCode

959832

Title

Author´s reply

Author

Chu, John T.

Author_Institution

Department of Industrial Engineering and Operations Research, New York University, Bronx, N. Y. 10453.

Issue

9

fYear

1972

Firstpage

1027

Lastpage

1028

Keywords

Error analysis; Error probability; Estimation; Pattern recognition; Probability density function; Upper bound;

fLanguage

English

Journal_Title

Computers, IEEE Transactions on

Publisher

ieee

ISSN

0018-9340

Type

jour

DOI

10.1109/TC.1972.5009088

Filename

5009088