DocumentCode :
9599
Title :
Numerical Determination of the Effective Magnetic Path Length of a Single-Sheet Tester
Author :
Hofmann, Martin ; Kahraman, Deniz ; Herzog, Hans-Georg ; Hoffmann, Michael J.
Author_Institution :
Daimler AG, Stuttgart, Germany
Volume :
50
Issue :
2
fYear :
2014
fDate :
Feb. 2014
Firstpage :
929
Lastpage :
932
Abstract :
We describe a numerical method for the correction of the magnetic field strength and power loss values measured by a single-sheet tester (SST) based on the current method. This operation is performed by a reluctance network that yields the effective path length of the SST by determining the parasitic magnetic voltage drops over the yoke, gaps, and parts of the probe underneath the pole faces. In contrast to common magnetic circuit analysis, we enforce the magnetic flux and the magnetomotive force simultaneously and treat the magnetic resistance of the specimen as a degree of freedom. Hereby, we avoid errors due to uncertainties in the description of the B-H characteristic of the specimen and can correct arbitrary working points covering hysteretic and dynamic effects. The validity of this approach is demonstrated on four grades of nonoriented electrical steel sheets. The network is used to determine the integral magnetic path length, which enables a convenient correction of the power loss for arbitrary magnetizations including harmonics.
Keywords :
finite element analysis; magnetic circuits; magnetic field measurement; network analysis; magnetic circuit analysis; magnetic field strength; magnetic flux; magnetomotive force; nonoriented electrical steel sheets; numerical determination; parasitic magnetic voltage drops; reluctance network; single-sheet tester magnetic path length; Iron; Loss measurement; Magnetic circuits; Magnetic hysteresis; Magnetic losses; Materials; Steel; Circuit analysis computing; finite-element (FE) methods; loss measurements; magnetic circuits; magnetic field measurement; magnetic losses; sheet materials;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.2013.2283499
Filename :
6749210
Link To Document :
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