DocumentCode
960051
Title
Analytical models and algorithms for the efficient signal integrity verification of inductance-effect-prominent multicoupled VLSI circuit interconnects
Author
Shin, Seongkyun ; Eo, Yungseon ; Eisenstadt, William R. ; Shim, Jongin
Author_Institution
Dept. of Electr. & Comput. Eng., Hanyang Univ., Seoul, South Korea
Volume
12
Issue
4
fYear
2004
fDate
4/1/2004 12:00:00 AM
Firstpage
395
Lastpage
407
Abstract
Novel signal integrity verification models and algorithms for inductance-effect- prominent RLC interconnect lines are developed by using a traveling-wave-based waveform approximation (TWA) technique. The multicoupled line responses are decoupled into the eigenmodes of the system in order to exploit the TWA technique. Then, the response signals are mathematically represented by the linear combination of each eigenmode response based on TWA, followed by reporting the signal integrity models and algorithms for the multicoupled lines. The signal integrity of VLSI circuit interconnects is complicatedly correlated with input signal switching-patterns, layout geometry, and termination conditions. It is shown that the technique can be efficiently employed for complicated multicoupled interconnect lines with various termination conditions and the signal transients based on the technique have excellent agreement with SPICE simulations. Thus, with the proposed technique, the switching-dependent signal delay, crosstalk, ringing, and glitches of the inductance-effect-prominent RLC interconnect lines can be accurately as well as efficiently determined.
Keywords
RLC circuits; SPICE; VLSI; circuit layout CAD; coupled transmission lines; crosstalk; eigenvalues and eigenfunctions; inductance; integrated circuit interconnections; integrated circuit layout; integrated circuit modelling; waveform analysis; SPICE simulations; VLSI circuit interconnects; closed form models; crosstalk; efficient computation algorithms; eigenmodes; glitches; inductance-effect-prominent multicoupled interconnects; multicoupled RLC lines; multicoupled line responses; ringing; signal integrity verification models; switching-dependent signal delay; system eigenmodes; three-pole-based response signal; traveling-wave-based waveform approximation; Analytical models; Approximation algorithms; Geometry; Integrated circuit interconnections; Mathematical model; RLC circuits; SPICE; Switching circuits; Termination of employment; Very large scale integration;
fLanguage
English
Journal_Title
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher
ieee
ISSN
1063-8210
Type
jour
DOI
10.1109/TVLSI.2004.825836
Filename
1288176
Link To Document