Title :
Theoretical Lifetime of Static Contacts
Author :
Takano, Erii ; Mano, K.
Author_Institution :
Tohoku University, Japan
fDate :
12/1/1967 12:00:00 AM
Keywords :
Conductive films; Conductivity; Contacts; Copper; Corrosion; Indium tin oxide; Inorganic materials; Insulation; Oxidation; Thickness control;
Journal_Title :
Parts, Materials and Packaging, IEEE Transactions on
DOI :
10.1109/TPMP.1967.1135732
