• DocumentCode
    960539
  • Title

    Demonstration of monolithic co-fabrication of Y1Ba2 Cu3O7-δ and CMOS devices on the same sapphire substrate

  • Author

    De La Houssaye, P.R. ; Burns, M.J. ; Russell, S.D. ; Garcia, Gonzalo Andres ; Lee, L.P.

  • Author_Institution
    NCCOSC RDTE DIV, San Diego, CA
  • Volume
    40
  • Issue
    11
  • fYear
    1993
  • fDate
    11/1/1993 12:00:00 AM
  • Firstpage
    2139
  • Lastpage
    2140
  • Abstract
    Summary form only given. The authors report the first fabrication of active semiconductor and high-temperature superconducting (HTS) devices on the same substrate. CMOS transistors were fabricated on the same sapphire substrate as either YBCO flux-flow transistors (FFTs) or YBCO superconducting quantum interference devices (SQUIDs). All devices functioned as expected at 77 K without degradation, demonstrating that a compatible process has been found to monolithically integrate adjacent CMOS and HTS devices
  • Keywords
    CMOS integrated circuits; SQUIDs; barium compounds; high-temperature superconductors; superconducting integrated circuits; yttrium compounds; 77 K; Al2O3; CMOS transistors; FFT; HTS devices; SQUID; Y1Ba2Cu3O7; active semiconductor; flux-flow transistors; high temperature superconducting device; monolithic cofabrication; monolithic integrated circuit; sapphire substrate; superconducting quantum interference devices; CMOS process; Degradation; Fabrication; Flexible printed circuits; High temperature superconductors; Interference; SQUIDs; Substrates; Superconducting devices; Yttrium barium copper oxide;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.239826
  • Filename
    239826