• DocumentCode
    960621
  • Title

    Normal incidence GaAs/AlGaAs multiple-quantum-well polarization modulator using an induced uniaxial strain

  • Author

    Pamulapati, J. ; Shen, Haiying ; Wraback, M. ; Taysing-Lara, M. ; Dutta, Maitreyee ; Lu, Yang

  • Author_Institution
    US Army Res. Lab., Fort Monmouth, NJ
  • Volume
    40
  • Issue
    11
  • fYear
    1993
  • fDate
    11/1/1993 12:00:00 AM
  • Firstpage
    2144
  • Lastpage
    2145
  • Abstract
    Summary form only given. A demonstration of a novel polarization modulator with light incident normal to the surface of the modulator is reported. The layered pattern in a multiple quantum well (MQW) breaks the full cubic symmetry of the host materials. These structures, though, reserve a fourfold rotation symmetry about the growth axis normal to (100) oriented substrates. A uniaxial stress applied in the plane of the structure further reduces this rotation symmetry, mixing the heavy and light hole bands and creating an anisotropy in the in-plane components of the dielectric function, thus allowing the use of this device as a polarization modulator with a contrast ratio ~55:1 with a 5 V applied bias. A p-i-n structure grown on (100) GaAs was used for the modulator. The intrinsic region consists of a 100-period, 150-Å GaAs/50-Å Al0.1Ga0.9As MQW
  • Keywords
    III-V semiconductors; aluminium compounds; electro-optical devices; gallium arsenide; integrated optics; optical modulation; semiconductor quantum wells; (100) substrate; 150 angstroms; 5 V; 50 angstroms; GaAs-Al0.1Ga0.9As; MQW; anisotropy; cubic symmetry; dielectric function; fourfold rotation symmetry; hole bands; induced uniaxial strain; layered pattern; multiple-quantum-well polarization modulator; normal incidence modulator; p-i-n structure; semiconductor; uniaxial stress; Anisotropic magnetoresistance; Dielectric devices; Dielectric materials; Dielectric substrates; Gallium arsenide; Optical modulation; Optical polarization; PIN photodiodes; Quantum well devices; Stress;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.239834
  • Filename
    239834