DocumentCode :
960697
Title :
AC losses of internally deposited Nb3Ge films
Author :
Kim, K.S. ; Kim, Y.B. ; Savage, J.W. ; Newkirk, L.R.
Author_Institution :
University of Southern California, Los Angeles, California
Volume :
13
Issue :
1
fYear :
1977
fDate :
1/1/1977 12:00:00 AM
Firstpage :
433
Lastpage :
435
Abstract :
Nb3Ge films deposited on the inside of a copper tube have been measured. The tubular sample was modified into a tape sample for measuring purposes. The total ac losses contain the substrate loss as well as the superconductor loss, and by varying the frequency and the field the two are separated. The plot of the loss vs. the surface roughness indicates that the losses in this case are dominated by the superconducting diffusion layer. The problem presented by the diffusion layer in any partially coated tape is stressed.
Keywords :
Conducting films; Superconducting cables; Superconducting materials; Circuits; Coils; Copper; Frequency measurement; Germanium; Loss measurement; Niobium compounds; Strips; Substrates; Superconducting films;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.1977.1059287
Filename :
1059287
Link To Document :
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