DocumentCode :
960875
Title :
Tunneling, X-ray and electron diffraction studies of the structure of Nb3Ge films
Author :
Rowell, J.M. ; Schmidt, P.H. ; Spencer, E.G. ; Dernier, P.D. ; Joy, D.C.
Author_Institution :
Bell Laboratories, Murray Hill, NJ
Volume :
13
Issue :
1
fYear :
1977
fDate :
1/1/1977 12:00:00 AM
Firstpage :
644
Lastpage :
647
Abstract :
In an attempt to understand the structure of high TcNb3Ge films we have utilized tunneling, x-ray diffraction and transmission electron diffraction. Tunneling experiments indicate that such films have an appreciable highly disordered component. In x-ray diffraction, only two anomalous diffraction peaks are observed which are not sufficient to identify the unknown phase. The complex electron diffraction patterns are interpreted most easily as evidence for superlattice formation. Finally we show that large lattice expansions and depressions of Tcare produced when Nb3Ge films are exposed to hydrofluoric acid, presumably due to inclusion of hydrogen.
Keywords :
Conducting films; Superconducting materials; Electrons; Germanium; Impurities; Niobium compounds; Sputtering; Superconducting films; Superconducting transition temperature; Tunneling; Vacuum systems; X-ray diffraction;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.1977.1059304
Filename :
1059304
Link To Document :
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