• DocumentCode
    960910
  • Title

    Region-Based Classification of Polarimetric SAR Images Using Wishart MRF

  • Author

    Wu, Yonghui ; Ji, Kefeng ; Yu, Wenxian ; Su, Yi

  • Author_Institution
    Nat. Univ. of Defense Technol., Changsha
  • Volume
    5
  • Issue
    4
  • fYear
    2008
  • Firstpage
    668
  • Lastpage
    672
  • Abstract
    The scattering measurements of individual pixels in polarimetric SAR images are affected by speckle; hence, the performance of classification approaches, taking individual pixels as elements, would be damaged. By introducing the spatial relation between adjacent pixels, a novel classification method, taking regions as elements, is proposed using a Markov random field (MRF). In this method, an image is oversegmented into a large amount of rectangular regions first. Then, to use fully the statistical a priori knowledge of the data and the spatial relation of neighboring pixels, a Wishart MRF model, combining the Wishart distribution with the MRF, is proposed, and an iterative conditional mode algorithm is adopted to adjust oversegmentation results so that the shapes of all regions match the ground truth better. Finally, a Wishart-based maximum likelihood, based on regions, is used to obtain a classification map. Real polarimetric images are used in experiments. Compared with the other three frequently used methods, higher accuracy is observed, and classification maps are in better agreement with the initial ground maps, using the proposed method.
  • Keywords
    geophysical techniques; image classification; image segmentation; radar polarimetry; synthetic aperture radar; Markov random field; Wishart MRF model; Wishart-based maximum likelihood; image oversegmentation; iterative conditional mode algorithm; polarimetric SAR images classification; scattering measurements; speckle; statistical a priori knowledge; Image classification; image segmentation; polarimetry; synthetic aperture radar (SAR);
  • fLanguage
    English
  • Journal_Title
    Geoscience and Remote Sensing Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1545-598X
  • Type

    jour

  • DOI
    10.1109/LGRS.2008.2002263
  • Filename
    4656471