Author :
Lorenz, G. ; Khadpe, S.
Author_Institution :
Hybrid Circuit Materials Development Group
fDate :
9/1/1981 12:00:00 AM
Keywords :
Hybrid integrated circuits; Chemical engineering; Circuit synthesis; Circuit testing; Conducting materials; Costs; Materials reliability; Materials testing; Microelectronics; Paper technology; Resistors;
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
DOI :
10.1109/TCHMT.1981.1135813
