Title :
Measurement of low impedance on chip power supply loop
Author :
Kantorovich, Isaac ; Houghton, Chris ; Root, Stephen ; St Laurent, Jim
Author_Institution :
Intel, Hudson, MA, USA
Abstract :
A new method of measuring the high frequency self-impedance and transfer impedance of a microprocessor´s power supply loop is proposed. The method is based on measurement of the on-chip voltage in response to a predetermined stimulus. Two methods of the stimulus current generation are presented: running a set of computer instructions and toggling clock frequency while the system is in reset.
Keywords :
electric impedance measurement; power supply circuits; chip power supply loop; computer instructions; high frequency self-impedance; low impedance; onchip voltage; predetermined stimulus; stimulus current generation; toggling clock frequency; transfer impedance; Clocks; Computer aided instruction; Current measurement; Frequency measurement; Impedance measurement; Packaging; Power measurement; Power supplies; Semiconductor device measurement; Voltage;
Journal_Title :
Advanced Packaging, IEEE Transactions on
DOI :
10.1109/TADVP.2004.825458
