DocumentCode :
961065
Title :
Impact of Microwave Interference on Dynamic Operation and Power Dissipation of CMOS Inverters
Author :
Kim, Kyechong ; Iliadis, Agis A.
Author_Institution :
Univ. of Maryland, College Park
Volume :
49
Issue :
2
fYear :
2007
fDate :
5/1/2007 12:00:00 AM
Firstpage :
329
Lastpage :
338
Abstract :
The effects of electromagnetic interference (EMI) from high-power microwave signals on CMOS inverters are reported. In order to study these effects more effectively, a novel analytical parameter extraction method, which allows us to predict the dynamic operation of the inverters under interference from experimentally measured load-line characteristics, is developed. Based on the method, the output voltages, output short-circuit currents, propagation delays, and dynamic power dissipation during EMI were extracted. The results showed that the inverters suffer severely from compressed output voltage swing, bit errors, significant changes in the propagation delays, and substantially increased short-circuit currents, as well as a large increase in dynamic power dissipation during logic state transition from high to low and vice versa. Scaling down of the inverters showed that such operational parameters of the devices were more strongly affected by the interference, resulting in significantly more vulnerable CMOS inverters.
Keywords :
CMOS digital integrated circuits; integrated circuit design; invertors; logic circuits; monolithic integrated circuits; radiofrequency interference; short-circuit currents; CMOS inverters; EMI; analytical parameter extraction method; bit errors; dynamic power dissipation; electromagnetic interference effects; high-power microwave signals; load-line characteristics; logic state transition; microwave interference; output short-circuit currents; output voltage swing; propagation delays; CMOS logic circuits; Electromagnetic interference; Inverters; Logic devices; Microwave devices; Parameter extraction; Power dissipation; Probes; Propagation delay; Voltage; CMOS inverters; device scaling; dynamic operation; electromagnetic interference (EMI); parameter extraction method; power dissipation; propagation delay;
fLanguage :
English
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9375
Type :
jour
DOI :
10.1109/TEMC.2007.893333
Filename :
4244602
Link To Document :
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