Title :
Simultaneous determination of device noise and gain parameters through noise measurements only
Author_Institution :
University di Palermo, Palermo, Italy
Abstract :
A novel method of measuring the noise and gain parameters of a linear two-port is presented. This method is based on the Friis formula to determine all the noise and gain parameters solely from noise figure measurements. This results in a much simplified procedure and improved accuracy over the conventional methods. An example using a low-noise transistor at 2 GHz is shown.
Keywords :
Admittance; Delay; Digital filters; Finite impulse response filter; Gain measurement; Lattices; Noise figure; Noise measurement; System testing; Transfer functions;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1980.11859
