DocumentCode :
961466
Title :
Nonparametric Estimation of the Bayes Error of Feature Extractors Using Ordered Nearest Neighbor Sets
Author :
Garnett, James M., III ; Yau, Stephen S.
Author_Institution :
Department of Electrical Engineering and the Biomedical Engineering Center, Northwestern University, Evanston, IL; Mitre Corporation, Bedford, MA, 01730.
Issue :
1
fYear :
1977
Firstpage :
46
Lastpage :
54
Abstract :
Since the Bayes classifier is the optimum classifier in the sense of having minimum probability of misclassification among all the classifiers using the same set of pattern features, the error rate of the Bayes classifier using the set of features provided by a feature extractor, called the Bayes error of the feature extractor, is the smallest possible for the feature extractor. Consequently, the Bayes error can be used to evaluate the effectiveness of the feature extractors in a pattern recognition system. In this paper, a nonparametric technique for estimating the Bayes error for any two-category feature extractor is presented. This technique uses the nearest neighbor sample sets and is based on an infinite series expansion of the general form of the Bayes error. It is shown that this technique is better than the existing methods, and the estimates obtained by this technique are more meaningful in evaluating the quality of feature extractors. Computer simulation as well as application to electrocardiogram analysis are used to demonstrate this technique.
Keywords :
Biomedical engineering; Computer errors; Computer simulation; Data mining; Error analysis; Feature extraction; Nearest neighbor searches; Pattern analysis; Pattern recognition; Probability density function; Bayes error; comparison; feature extractors; nearest neighbor sets; nonparametric estimation; pattern recognition systems; series expansion;
fLanguage :
English
Journal_Title :
Computers, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9340
Type :
jour
DOI :
10.1109/TC.1977.5009273
Filename :
5009273
Link To Document :
بازگشت