DocumentCode :
961725
Title :
The Failure Mode and Lifetime of Static Contacts
Author :
Takano, Eisuke ; Mano, K.
Author_Institution :
Tohoku University,Japan
Volume :
4
Issue :
2
fYear :
1968
fDate :
6/1/1968 12:00:00 AM
Firstpage :
51
Lastpage :
55
Abstract :
This paper describes the failure mode due to corrosion at the contacting surfaces of static contacts in connectors and mechanical wiring connections. Copper static contacts with no mechanical separation fail to maintain electrical continuity when temperature-cycled from 20 to 200°C. Electron diffraction analysis and microscopic inspection show that this failure mode is due to growth of Cu2O film over all or part of the contacting surfaces. The lay? between the contact members is estimated to be 15 to 3250 A thick and the lifetime of the copper static contact at light loads is proportional to load.
Keywords :
Connectors; Contacts; Copper; Corrosion; Diffraction; Electron microscopy; Failure analysis; Inspection; Life estimation; Wiring;
fLanguage :
English
Journal_Title :
Parts, Materials and Packaging, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9502
Type :
jour
DOI :
10.1109/TPMP.1968.1135887
Filename :
1135887
Link To Document :
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