• DocumentCode
    961777
  • Title

    A survey of heterojunction bipolar transistor (HBT) device reliability

  • Author

    Livingston, Henry

  • Author_Institution
    Inf. & Electron. Warfare Syst., BAE Systems, Nashua, NH, USA
  • Volume
    27
  • Issue
    1
  • fYear
    2004
  • fDate
    3/1/2004 12:00:00 AM
  • Firstpage
    225
  • Lastpage
    228
  • Abstract
    Heterojunction bipolar transistor (HBT) technology has become a major player in wireless communication, power amplifier, mixer, and frequency synthesizer applications. HBTs extend the advantages of silicon bipolar transistors to significantly higher frequencies. Since the mid-1980s, HBT technology development has focussed on reducing cost and improving reliability which, in turn, led to numerous commercial products, such as prescalers, gate arrays, digital-to-analog converters, mux/demux chip sets, logarithmic amplifiers, RF chip sets for CDMA wireless communication systems, and power amplifiers for cellular communications. They have become a natural choice for very high frequency military applications requiring a high current drive, high transconductance, high voltage handling capability, low noise oscillator, and uniform threshold voltage. Emerging HBT technologies allow the integration of a large quantity of high performance RF circuits and high speed digital circuits on a single chip. This paper provides an overview of HBT device reliability issues.
  • Keywords
    heterojunction bipolar transistors; integrated circuit reliability; semiconductor device reliability; HBT; heterojunction bipolar transistor; integrated circuit reliability; semiconductor device reliability; Frequency synthesizers; Heterojunction bipolar transistors; Mixers; Power amplifiers; Power system reliability; Radio frequency; Radiofrequency amplifiers; Silicon; Threshold voltage; Wireless communication;
  • fLanguage
    English
  • Journal_Title
    Components and Packaging Technologies, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3331
  • Type

    jour

  • DOI
    10.1109/TCAPT.2004.827642
  • Filename
    1288330