DocumentCode
961777
Title
A survey of heterojunction bipolar transistor (HBT) device reliability
Author
Livingston, Henry
Author_Institution
Inf. & Electron. Warfare Syst., BAE Systems, Nashua, NH, USA
Volume
27
Issue
1
fYear
2004
fDate
3/1/2004 12:00:00 AM
Firstpage
225
Lastpage
228
Abstract
Heterojunction bipolar transistor (HBT) technology has become a major player in wireless communication, power amplifier, mixer, and frequency synthesizer applications. HBTs extend the advantages of silicon bipolar transistors to significantly higher frequencies. Since the mid-1980s, HBT technology development has focussed on reducing cost and improving reliability which, in turn, led to numerous commercial products, such as prescalers, gate arrays, digital-to-analog converters, mux/demux chip sets, logarithmic amplifiers, RF chip sets for CDMA wireless communication systems, and power amplifiers for cellular communications. They have become a natural choice for very high frequency military applications requiring a high current drive, high transconductance, high voltage handling capability, low noise oscillator, and uniform threshold voltage. Emerging HBT technologies allow the integration of a large quantity of high performance RF circuits and high speed digital circuits on a single chip. This paper provides an overview of HBT device reliability issues.
Keywords
heterojunction bipolar transistors; integrated circuit reliability; semiconductor device reliability; HBT; heterojunction bipolar transistor; integrated circuit reliability; semiconductor device reliability; Frequency synthesizers; Heterojunction bipolar transistors; Mixers; Power amplifiers; Power system reliability; Radio frequency; Radiofrequency amplifiers; Silicon; Threshold voltage; Wireless communication;
fLanguage
English
Journal_Title
Components and Packaging Technologies, IEEE Transactions on
Publisher
ieee
ISSN
1521-3331
Type
jour
DOI
10.1109/TCAPT.2004.827642
Filename
1288330
Link To Document