• DocumentCode
    961967
  • Title

    Dielectric Films in Aluminum and Tantalum Electrolytic and Solid Tantalum Capacitors

  • Author

    Burnham, John

  • Volume
    4
  • Issue
    3
  • fYear
    1957
  • fDate
    9/1/1957 12:00:00 AM
  • Firstpage
    73
  • Lastpage
    82
  • Abstract
    The characteristics of electrolytic capacitors are determined primarily by the nature of the dielectric oxide film. The nature of this film and the factors which influence its physical and chemical characteristics are discussed. Electron photomicrographs of the electrolytic oxide film on aluminum, as well as X-ray diffraction and direct electrical measurements of the dry oxide film, reveal that it is crystalline gamma-A12Oa. The characteristics of electrolytic Ta205films on tantalum are compared with those on aluminum, and the factors that make tantalum capacitors more reliable are indicated.
  • Keywords
    Aluminum; Capacitors; Chemicals; Crystallization; Dielectric films; Dielectric measurements; Electric variables measurement; Electrons; Solids; X-ray diffraction;
  • fLanguage
    English
  • Journal_Title
    Component Parts, IRE Transactions on
  • Publisher
    ieee
  • ISSN
    0096-2422
  • Type

    jour

  • DOI
    10.1109/TCP.1957.1135911
  • Filename
    1135911
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=961967