DocumentCode :
961967
Title :
Dielectric Films in Aluminum and Tantalum Electrolytic and Solid Tantalum Capacitors
Author :
Burnham, John
Volume :
4
Issue :
3
fYear :
1957
fDate :
9/1/1957 12:00:00 AM
Firstpage :
73
Lastpage :
82
Abstract :
The characteristics of electrolytic capacitors are determined primarily by the nature of the dielectric oxide film. The nature of this film and the factors which influence its physical and chemical characteristics are discussed. Electron photomicrographs of the electrolytic oxide film on aluminum, as well as X-ray diffraction and direct electrical measurements of the dry oxide film, reveal that it is crystalline gamma-A12Oa. The characteristics of electrolytic Ta205films on tantalum are compared with those on aluminum, and the factors that make tantalum capacitors more reliable are indicated.
Keywords :
Aluminum; Capacitors; Chemicals; Crystallization; Dielectric films; Dielectric measurements; Electric variables measurement; Electrons; Solids; X-ray diffraction;
fLanguage :
English
Journal_Title :
Component Parts, IRE Transactions on
Publisher :
ieee
ISSN :
0096-2422
Type :
jour
DOI :
10.1109/TCP.1957.1135911
Filename :
1135911
Link To Document :
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