• DocumentCode
    961985
  • Title

    Fundamental limits on EMC

  • Author

    Showers, Ralph M. ; Schulz, Richard B. ; Lin, Shaw-Yueh

  • Author_Institution
    University of Pennsylvania, Philadelphia, PA
  • Volume
    69
  • Issue
    2
  • fYear
    1981
  • Firstpage
    183
  • Lastpage
    195
  • Abstract
    Both fundamental and state-of-the-art limits are treated, with emphasis on the former. Fundamental limits result from both natural and man-made electromagnetic noise which then affect two basic ratios, signal-to-noise (S/N) and extraneous-input-to-noise (I/N). Tolerable S/N values are discussed for both digital and analog communications systems. These lead to tolerable signal-to-extraneous-input (S/I) ratios, again for digital and analog communications systems, as well as radar and sonar. State-of-the-art limits for transmitters include RF noise emission, spurious emissions, and intermodulation. Receiver limits include adjacent-channel interactions, image, IF, and other spurious responses, including cross modulation, intermodulation, and desensitization. Unintentional emitters and receivers are also discussed. Coupling limitations between undesired sources and receptors are considered from mechanisms including radiation, induction, and conduction.
  • Keywords
    Electromagnetic compatibility; Electromagnetic compatibility and interference; Electromagnetic devices; Electromagnetic interference; Radar; Radio frequency; Signal to noise ratio; Silicon compounds; Sonar; Transmitters;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1981.11951
  • Filename
    1456219