• DocumentCode
    962078
  • Title

    CMOS-Compatible All-Si High-Speed Waveguide Photodiodes With High Responsivity in Near-Infrared Communication Band

  • Author

    Geis, M.W. ; Spector, S.J. ; Grein, M.E. ; Schulein, R.T. ; Yoon, J.U. ; Lennon, D.M. ; Deneault, S. ; Gan, F. ; Kaertner, F.X. ; Lyszczarz, T.M.

  • Author_Institution
    Lincoln Lab., MIT, Lexington, MA
  • Volume
    19
  • Issue
    3
  • fYear
    2007
  • Firstpage
    152
  • Lastpage
    154
  • Abstract
    Submicrometer silicon photodiode waveguides, fabricated on silicon-on-insulator substrates, have photoresponse from <1270 to 1740 nm (0.8 AW-1 at 1550 nm) and a 3-dB bandwidth of 10 to 20 GHz. The p-i-n photodiode waveguide consists of an intrinsic waveguide 500times250 nm where the optical mode is confined and two thin, 50-nm-thick, doped Si wings that extend 5 mum out from either side of the waveguide. The Si wings, which are doped one p-type and the other n-type, make electric contact to the waveguide with minimal effect on the optical mode. The edges of the wings are metalized to increase electrical conductivity. Ion implantation of Si+ 1times10 13 cm-2 at 190 keV into the waveguide increases the optical absorption from 2-3 dBmiddotcm-1 to 200-100 dBmiddotcm-1 and causes the generation of a photocurrent when the waveguide is illuminated with subbandgap radiation. The diodes are not damaged by annealing to 450 degC for 15 s or 300 degC for 15 min. The photoresponse and thermal stability is believed due to an oxygen stabilized divacancy complex formed during ion implantation
  • Keywords
    CMOS integrated circuits; annealing; electrical contacts; infrared detectors; integrated optics; integrated optoelectronics; ion implantation; optical communication equipment; optical fibre communication; optical waveguides; p-i-n photodiodes; photodetectors; silicon; silicon-on-insulator; thermal stability; 15 min; 15 s; 1550 nm; 190 keV; 250 nm; 300 degC; 450 degC; 50 nm; 500 nm; CMOS-compatible photodiodes; Si-SiO2; all-Si photodiodes; annealing; electric contact; electrical conductivity; high-responsivity photodiodes; high-speed photodiodes; intrinsic waveguides; ion implantation; near-infrared communication band; near-infrared photodetectors; optical absorption; optical mode; oxygen stabilized divacancy complex; photocurrent; photoresponse; silicon-on-insulator substrates; subbandgap radiation; thermal stability; waveguide photodiodes; Absorption; Bandwidth; Conductivity; Contacts; High speed optical techniques; Ion implantation; Optical waveguides; PIN photodiodes; Particle beam optics; Silicon on insulator technology; Integrated optoelectronics; near-infrared; photodetectors; silicon (Si) optoelectronics; silicon (Si) waveguide;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/LPT.2006.890109
  • Filename
    4060964