DocumentCode :
962265
Title :
Modification of transconductance characteristics for ion-implanted GaAs/AlGaAs heterojunction MESFETs
Author :
Feng, Ming ; Kaliski, Rafael ; Lau, C.L. ; Ito, C.
Volume :
25
Issue :
11
fYear :
1989
fDate :
5/25/1989 12:00:00 AM
Firstpage :
713
Lastpage :
715
Abstract :
Inverted GaAs/AlGaAs heterostructures grown by MOCVD have been used to fabricate conventional ion-implanted MESFETs. Two types of GaAs/AlGaAs heterojunctions are studied. One type has a compositionally graded AlGaAs layer which provides a built-in field and corresponding quantum well at the heterointerface. The other type has a constant-composition AlGaAs layer. 0.5 mu m gate devices fabricated using the ungraded AlGaAs layer show a maximum extrinsic transconductance Gm of 280 mS/mm and a small Gm variation over a gate voltage range of 1.5 V. In comparison, devices fabricated using the graded AlGaAs layer exhibit higher transconductance over all the gate voltages and an enhancement of Gm up to 420 mS/mm at low gate bias.
Keywords :
III-V semiconductors; Schottky gate field effect transistors; aluminium compounds; electric admittance; gallium arsenide; ion implantation; semiconductor quantum wells; 0.5 micron; 280 mS; 420 mS; GaAs-AlGaAs; MOCVD; built-in field; compositionally graded AlGaAs layer; constant-composition AlGaAs layer; gate voltage range; ion implanted heterojunction MESFET; maximum extrinsic transconductance; quantum well; transconductance characteristics;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19890483
Filename :
24095
Link To Document :
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