Title :
Stuck-At Fault Tests in the Presence of Undetectable Bridging Faults
Author :
Yamada, Teruhiko ; Nanya, Takashi
Author_Institution :
C&C Systems Research Laboratories, NEC Corporation, Kawasaki, 213, Japan.
Abstract :
Undetectable bridging faults between two arbitrary leads, which may produce feedback loops, in a unate two-level irredundant AND-OR network are anlyzed and their effect on stuck-at fault detection tests is explored. As a result, any complete test set for single stuck-at faults proves to still remain valid in the presence of undetectable bridging faults.
Keywords :
Bibliographies; Circuit faults; Computer science; Fault detection; Feedback loop; Hydrogen; Laboratories; Large scale integration; Logic testing; National electric code; Bridging faults; fault detection; stuck-at fault tests; test generation; unate two-level networks; undetectable bridging faults;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1984.5009367
