DocumentCode :
962363
Title :
Signature Testing of Sequential Machines
Author :
Hassan, Syed Zahoor
Author_Institution :
Center for Reliable Computing, Computer Systems Laboratory, Departments of Electrical Engineering and Computer Science, Stanford University, Stanford, CA 94305.
Issue :
8
fYear :
1984
Firstpage :
762
Lastpage :
764
Abstract :
A new approach to the testing of sequential machines is presented which employs signature analysis. In the conventional scheme of testing sequential finite state machines, distinguishing and transfer sequences are used. For the purposes of testing sequential machines by signature analysis, a signature distinguishing sequence is defined. An algorithm for augmenting a sequential machine by introducing an extra input is presented. This yields a sequential machine that has a signature distinguishing sequence. The additional cost in terms of the chip area for a programmable logic array (PLA) implementation is calculated.
Keywords :
Circuit testing; Combinational circuits; Costs; Hardware; Logic testing; Polynomials; Programmable logic arrays; Sequential analysis; Sequential circuits; System testing; LFSR; sequential machines; signature analysis; testing;
fLanguage :
English
Journal_Title :
Computers, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9340
Type :
jour
DOI :
10.1109/TC.1984.5009368
Filename :
5009368
Link To Document :
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