• DocumentCode
    962482
  • Title

    Empirical formulas for MIS microstrip line parameters

  • Author

    Tedjini, Smail

  • Author_Institution
    Lab. d´Electromagnetisme, Microondes & Optoelectronique, ENSERG, Grenoble, France
  • Volume
    25
  • Issue
    11
  • fYear
    1989
  • fDate
    5/25/1989 12:00:00 AM
  • Firstpage
    739
  • Lastpage
    741
  • Abstract
    A method is proposed to obtain closed-form empirical formulas to calculate the effective dielectric constant, the attenuation constant and the characteristic impedance of a microstrip line on an Si-SiO2 structure for varying strip width and frequency. The formulas are valid in both the slow-wave mode (low frequency) and the skin-effect mode (high frequency). The dielectric mode is not taken into account. for strip widths varying from 30 mu m to 80 mu m, high accuracy was obtained.
  • Keywords
    MMIC; electric impedance; metal-insulator-semiconductor structures; permittivity; skin effect; strip lines; 30 to 80 micron; HF mode; LF mode; MIS microstrip line parameters; MMIC; Si-SiO 2 structure; attenuation constant; characteristic impedance; closed-form empirical formulas; effective dielectric constant; high frequency; low frequency; monolithic microwave IC; skin-effect mode; slow-wave mode; strip width;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19890500
  • Filename
    24112
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=962482