Title :
Measurements on CMOS circuit internal loads using capacitive pads
Author :
Rojder, P. ; Svensson, Christer
Author_Institution :
LSI Design Center, Linkoping Univ., Sweden
fDate :
5/25/1989 12:00:00 AM
Abstract :
A new method for measurements on internal nodes in CMOS circuits without severe loading is proposed. The method is based on the use of capacitive pads and can be used up to 200 MHz. Simulations and some practical measurements are demonstrated.
Keywords :
CMOS integrated circuits; integrated circuit testing; 200 MHz; CMOS circuit; IC test method; capacitive pads; internal loads; internal nodes; measurements;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19890510
