• DocumentCode
    962657
  • Title

    Major Circuit Yield Improvement: Yours for the Price of Minor Resistor Redesign

  • Author

    Jacobs, Wayne ; Hitch, Thomas T.

  • Author_Institution
    Johnson Matthey, Inc., San Diego, CA, USA
  • Volume
    5
  • Issue
    4
  • fYear
    1982
  • fDate
    12/1/1982 12:00:00 AM
  • Firstpage
    388
  • Lastpage
    394
  • Abstract
    A method has been developed to optimize thick film resistor geometries for maximum manufacturing yield by utilizing the mathematics of the normal distribution curve. Use of the method introduces minor changes in registor geometry to increase the size of the manufacturing window, and thereby to greatly reduce the number of reject circuits. The optimization method is described with examples from an actual redesign of a heart Pacer thick film circuit. Sample calculations are made and tables are shown giving complete results for selected resistors. Production yield results are given for the heart pacer circuit. These results show that large yield improvements were in fact achieved on a difficult circuit by use of this Optimization method.
  • Keywords
    Thick-film circuits; Thick-film resistors; Gaussian distribution; Geometry; Heart; Manufacturing; Mathematics; Optimization methods; Production; Resistors; Thick film circuits; Thick films;
  • fLanguage
    English
  • Journal_Title
    Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0148-6411
  • Type

    jour

  • DOI
    10.1109/TCHMT.1982.1135981
  • Filename
    1135981