Title :
Testing analogue functions using m-sequences
Author_Institution :
Dept. of Electr. & Electron. Eng., Newcastle Upon Tyne Univ., UK
Abstract :
A prototype systems level approach to testing embedded analogue functions in VLSI circuits is described. The technique is self-contained and can be used for wafer, package and field testing. The technique can be easily integrated into a digital test environment. The fault detection capabilities of the method are demonstrated by simulation results.
Keywords :
VLSI; automatic testing; binary sequences; built-in self test; fault location; integrated circuit testing; mixed analogue-digital integrated circuits; BIST; VLSI circuits; digital test environment; embedded analogue functions; fault detection capabilities; field testing; m-sequences;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19931209
