• DocumentCode
    963016
  • Title

    Fault Isolation Technique Cuts Testing Costs

  • Author

    Armoni, Abraham

  • Author_Institution
    Computer Automation,Inc.,Irvine, CA
  • Volume
    5
  • Issue
    1
  • fYear
    1976
  • fDate
    3/1/1976 12:00:00 AM
  • Firstpage
    2
  • Lastpage
    8
  • Keywords
    Automatic testing; Integrated circuit testing; Logic circuit fault diagnosis; Printed circuits; Production testing; Semiconductor device economies; Automatic testing; Circuit faults; Circuit testing; Costs; Logic circuits; Logic testing; Manufacturing; Performance evaluation; Printed circuits; System testing;
  • fLanguage
    English
  • Journal_Title
    Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0046-838X
  • Type

    jour

  • DOI
    10.1109/TMFT.1976.1136014
  • Filename
    1136014
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=963016