Title :
Can a User Test LSI Microprocessors Effectively?
Author_Institution :
Sperry Univac,Blue Bell, PA
fDate :
3/1/1976 12:00:00 AM
Abstract :
This paper elucidates user oriented test philosophy for LSI microprocessors. Also, a low-cost incoming inspection tester is described. The significant difference between this and available testers is the use of probabilistic scheme by which the instruction, data, and control signal mixes are generated. This approach reduced significantly tester hardware and supporting software without compromise of overall test performance.
Keywords :
Computer testing; Integrated circuit testing; Microprocessors; Circuit testing; Costs; Inspection; Large scale integration; Logic devices; Microprocessors; Read only memory; Signal generators; Software testing; System testing;
Journal_Title :
Manufacturing Technology, IEEE Transactions on
DOI :
10.1109/TMFT.1976.1136017
