DocumentCode :
963085
Title :
Guest Editor´s Introduction
Author :
Kutcher, G.
Author_Institution :
IEEE MFT
Volume :
5
Issue :
1
fYear :
1976
fDate :
3/1/1976 12:00:00 AM
Firstpage :
1
Lastpage :
1
Keywords :
Automatic testing; Chapters; Data engineering; Finance; Manufacturing automation; Quality control; Sampling methods; Semiconductor device manufacture; Semiconductor device reliability; Technology forecasting;
fLanguage :
English
Journal_Title :
Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
0046-838X
Type :
jour
DOI :
10.1109/TMFT.1976.1136019
Filename :
1136019
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=963085
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