DocumentCode :
963107
Title :
Transistor S parameter measurement: 2-port to 3-port transforms
Author :
Woods, Don
Author_Institution :
University of Surrey, Department of Chemical Physics, Guildford, UK
Volume :
7
Issue :
16
fYear :
1971
Firstpage :
451
Lastpage :
452
Abstract :
In 2-port s parameter measurements on active devices, residual common-electrode impedance can cause serious errors, particularly in the common-emitter configuration. Transforms have already been given for the elimination of this impedance prior to transformation to the corresponding 3-port parameters for checking the sum-to-unity property. It is shown that, by combining the two sets of transforms, it is possible to convert directly from the measured 2-port parameters, including the effect of common-electrode impedance, to 3-port parameters. The necessary circuit conditions that must be satisfied in the use of the transforms are re-emphasised.
Keywords :
characteristics measurement; transforms; transistors; residual common electrode impedance; two port to three port coaxial jig;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19710306
Filename :
4244911
Link To Document :
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