Title :
TMR crystal controlled clock
Author :
Ali, K. S Asraph ; Reddy, V. C V Pratapa
Author_Institution :
Indian Institute of Technology, Madras, India
fDate :
6/1/1981 12:00:00 AM
Abstract :
Triple modular redundant circuit for clock generation has been fabricated using CMOS gates and the test results for different types of single fault conditions are presented.
Keywords :
Bandwidth; Circuit faults; Circuit testing; Clocks; Crystals; Probability density function; Random processes; Resonant frequency; Switches; Voltage;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1981.12060
