• DocumentCode
    963601
  • Title

    GaAs photodetectors integrated with lithium niobate waveguides

  • Author

    Chan, W.K. ; Yi-Yan, A. ; Gmitter, T. ; Florez, L.T. ; Jackel, J.L. ; Yablonovitch, Eli ; Bhat, Ritesh ; Harbison, J.P.

  • Author_Institution
    Bellcore, Red Bank, NJ, USA
  • Volume
    36
  • Issue
    11
  • fYear
    1989
  • fDate
    11/1/1989 12:00:00 AM
  • Firstpage
    2627
  • Lastpage
    2628
  • Abstract
    Summary form only given. The authors report on the application of an epitaxial lift-off to achieve the integration of a semiconductor device with an LiNbO3 optical waveguide and on the optical interaction between the two. The semiconductor device is a GaAs metal-semiconductor-metal photodetector that was processed entirely after the epitaxial lift-off. Because of the high index of refraction difference between the two materials, light evanescently couples readily from the low-index waveguide into the high-index GaAs photodetector. HeNe laser light ( lambda =633 nm) was prism coupled into the waveguide. Light was totally extinguished within approximately 1 mm from the edge of the GaAs film. The photocurrent of the first detector, which was about 150 mu m behind the leading edge of the GaAs, was 6 mu A with 0.5-mW incident laser power. The second detector, 100 mu m behind the first, gave 4 mu A of photocurrent. These photocurrents correspond to a waveguide-detector absorption coefficient of 40 cm-1.
  • Keywords
    III-V semiconductors; gallium arsenide; lithium compounds; metal-semiconductor-metal structures; optical couplers; optical waveguides; photodetectors; 633 nm; GaAs photodetectors; GaAs-LiNbO3; HeNe laser light; LiNbO3 optical waveguide; epitaxial lift-off; evanescent coupling; index of refraction difference; light evanescently couples; metal-semiconductor-metal photodetector; optical interaction; photodetector waveguide integration; semiconductors; waveguide-detector absorption coefficient; Gallium arsenide; Integrated optics; Lithium niobate; Optical films; Optical refraction; Optical waveguides; Photoconductivity; Photodetectors; Semiconductor devices; Semiconductor waveguides;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.43755
  • Filename
    43755